A Study of Improving TFT-LCD Yield
碩士 === 華梵大學 === 工業工程與經營資訊學系碩士班 === 94 === Under consideration of reducing operating cost, some TFT-LCD panel manufacturers use join first break later method in their cell process. The problem with this approach is the unavoidable yield loss due to the joining of defective panels to the good ones whi...
| Main Authors: | , |
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| Other Authors: | |
| Format: | Others |
| Language: | zh-TW |
| Published: |
2006
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| Online Access: | http://ndltd.ncl.edu.tw/handle/80505707590754664413 |