Thermal Analysis And Reliability Test For CMOS Image Sensor

碩士 === 義守大學 === 機械與自動化工程學系碩士班 === 94 === Due to huge demand for optical mouse, digital cameras, photo-mobile phones, web-cam and optoelectronic devices in home entertainment in recent years, the production and packaging techniques for CMOS image sensor (CIS) have been rapidly developed and improved....

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Bibliographic Details
Main Authors: Hui-Yu Lee, 李輝宇
Other Authors: Hsiung-Chen Hsu
Format: Others
Language:zh-TW
Published: 2006
Online Access:http://ndltd.ncl.edu.tw/handle/43014006181526943867