Design and develop a novel microtensile apparatus to measure the mechanical properties of thin films
碩士 === 國立中興大學 === 精密工程學系所 === 94 === In this research, we present a novel designed microtensile testing apparatus that is capable of measuring the mechanical properties of free-standing thin film materials. Its unique sensor beam design causes stress and stain of the materials to be obtained directl...
| Main Authors: | , |
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| Other Authors: | |
| Format: | Others |
| Language: | zh-TW |
| Published: |
2006
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| Online Access: | http://ndltd.ncl.edu.tw/handle/11894586323282016809 |