Investigations on Damascene Process for ULSI Interconnects

博士 === 國立交通大學 === 材料科學與工程系所 === 94 === In semiconductor manufacturing, as device dimensions continue shrinking into deep sub-micro regime, high packing density Cu multilevel interconnection technology has been developed due to its lower resistance and parasitic capacitance for increasing ULSI operat...

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Bibliographic Details
Main Authors: Shao-Yu Chiu, 邱紹裕
Other Authors: Yi Chang
Format: Others
Language:en_US
Published: 2005
Online Access:http://ndltd.ncl.edu.tw/handle/55011726231624919685