Study of Nano-scale Copper Metallization on Damascene Process Integration for Semiconductor Integrated Circuits

博士 === 國立交通大學 === 材料科學與工程系所 === 94 === With semiconductor manufacture shrunk down to the 100 nm technology, the interconnection of the device would be faced to the nano-scale manufacturing and integration. The nano-scale interconnection could reduce the high power consumption and heat accumulation,...

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Bibliographic Details
Main Authors: Kei-Wei Chen, 陳科維
Other Authors: Li Chang
Format: Others
Language:en_US
Published: 2006
Online Access:http://ndltd.ncl.edu.tw/handle/69376191632345128800