Channel Non-uniformity induced Current Fluctuation due to Random Telegraph Noise in sub-100nm MOSFETs

碩士 === 國立交通大學 === 電子工程系所 === 94 ===

Bibliographic Details
Main Author: 薛至宸
Other Authors: 汪大暉
Format: Others
Language:zh-TW
Published: 2006
Online Access:http://ndltd.ncl.edu.tw/handle/96293395140528389177