Bat-Wing: An Inductive Model for Wafer Map Characterization and Generation
碩士 === 國立中央大學 === 電機工程研究所 === 94 === Under the process variation, the yield of the chips which are at the different locations with different characterization is in the same wafer. Because of the characterization of the yield of the process variation, it is the easiest observation from the viewpoint...
| Main Authors: | , |
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| Other Authors: | |
| Format: | Others |
| Language: | zh-TW |
| Published: |
2006
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| Online Access: | http://ndltd.ncl.edu.tw/handle/65kqt4 |