High Performance Built-in Current-Sensor Design for IDDQ Testing
碩士 === 國立東華大學 === 電機工程學系 === 94 === This thesis proposes a built-in current sensor (BICS) circuit design for IDDQ testing in SRAM applications. IDDQ testing is a powerful technique for detecting defects in CMOS circuits. The general idea of the IDDQ testing is to measure and observe the short curren...
| Main Authors: | , |
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| Other Authors: | |
| Format: | Others |
| Language: | en_US |
| Published: |
2006
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| Online Access: | http://ndltd.ncl.edu.tw/handle/78920105216195560126 |