Determination of polarization charge density on interface of AlGaN/GaN heterostructure by electroreflectance

碩士 === 國立中山大學 === 物理學系研究所 === 94 === Electroreflectance spectra of AlGaN/GaN heteostructure were measured for various biased voltage (Vbias). There are Franz-Keldysh oscillations (FKOs) exhibiting above band gap of AlGaN, and strength of electric field of AlGaN (FAlGaN) can be evaluated from periods...

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Bibliographic Details
Main Authors: Chia-Chun Wu, 吳家駿
Other Authors: Dong-Po Wang
Format: Others
Language:zh-TW
Published: 2006
Online Access:http://ndltd.ncl.edu.tw/handle/76547583355347081862