X-Ray Three-Beam Resonance Diffraction Study on Thin Film Systems
博士 === 國立清華大學 === 物理學系 === 94 === The investigation of the interfacial strusture of multi-layered thin film systems has been regarded as an important issue due to its high relevance to some particular properties of these systems. Owing to its complex structural geometry, obtaining the information o...
| Main Authors: | , |
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| Other Authors: | |
| Format: | Others |
| Language: | en_US |
| Published: |
2006
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| Online Access: | http://ndltd.ncl.edu.tw/handle/19880835432039085155 |