The Optimization for X-Ray Computer Tomography on BGA Inspection

碩士 === 國立清華大學 === 動力機械工程學系 === 94 === Electronics manufacturing and IC packaging & testing industries confront the tendencies of higher component density and Pb-free manufacturing process in the future. Traditional two-dimension automatic optical inspection machine is limited by several factors,...

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Bibliographic Details
Main Authors: Hsin-I Lu, 呂信億
Other Authors: Shin-Chieh Lin
Format: Others
Language:zh-TW
Published: 2006
Online Access:http://ndltd.ncl.edu.tw/handle/41338442014553926590