Test Protocol Design and its Implementation for the Wireless Test System

碩士 === 國立清華大學 === 資訊工程學系 === 94 === As IC design entering deep sub-micron age, integrating a system into a single chip called SoC (System on Chip) is possible. SoC often contain complex system functions in it. However, SoC also brings the testing challenges. The omplex functions in SoC makes the tes...

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Bibliographic Details
Main Authors: Chun-Yuan Lee, 李俊源
Other Authors: Chih-Tsun Huang
Format: Others
Language:en_US
Published: 2006
Online Access:http://ndltd.ncl.edu.tw/handle/63311375302986910195