| Summary: | 碩士 === 國立清華大學 === 資訊工程學系 === 94 === As IC design entering deep sub-micron age, integrating a system into a single chip called SoC (System on Chip) is possible. SoC often contain complex system functions in it. However, SoC also brings the testing challenges. The omplex functions in SoC makes the testing harder than before. Testing expense in SoC also arises due to the advance of deep submicron technology. Applying traditional test method to catch up testing quality in SoC is di±cult. Thus, we need to develop a new test method to test SoC.
Wireless test system is proposed to resolve test di±culty in traditional test method. Wireless test system removes the probe card in traditional test. Instead, a pair of transceiver equipped in the atuomatic test equipment (ATE) and device under test (DUT) can do the wireless test probing. However, test data transmission and test operation control is not easy in wireless test system. We proposed a test transmission protocol and a test control
architecture called TMU module for wireless test system. With our proposed test transmission protocol and test control architecture, SoC test can easily migrate from traditional test method to wireless test method.
Finally, a wireless test system prototype has been implemented using CC2500 RF module and FPGA board. It supports memory built-in self test (BIST), built-in self diagnosis (BISD), and Viterbi logic BIST. The wireless transmission is controlled by speci¯c media access control (MAC) module. In this prototype, we realized the proposed test transmission protocol and test control architecture in collaboration with MAC module, RF module, DFT module, DUTs, and PC-based ATE by di®erent research groups. Our TMU module can communicate to these test enhancement design and thus control the SoC test operations. The TMU module also can communicate to MAC module, so that TMU can process our proposed test transmission protocol packet without control the wireless data transmission.
Experimental results show that the test transmission protocol and test control architecture can enhance the controllability on wireless test system, and reduce the difficulties in test method migration.
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