Analysis of thin-film transistors with various nonidealities and light illumination
碩士 === 國立清華大學 === 電子工程研究所 === 94 === The first part of the thesis is to investigate by simulation the I-V curve of the thin film transistor with various defects during manufacturing processes. We change material parameters to simulate the devices in MEDICI and study the effects of various defects in...
Main Authors: | , |
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Other Authors: | |
Format: | Others |
Language: | zh-TW |
Published: |
2006
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Online Access: | http://ndltd.ncl.edu.tw/handle/96235733339930486968 |