Analysis of thin-film transistors with various nonidealities and light illumination
碩士 === 國立清華大學 === 電子工程研究所 === 94 === The first part of the thesis is to investigate by simulation the I-V curve of the thin film transistor with various defects during manufacturing processes. We change material parameters to simulate the devices in MEDICI and study the effects of various defects in...
| Main Authors: | , |
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| Other Authors: | |
| Format: | Others |
| Language: | zh-TW |
| Published: |
2006
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| Online Access: | http://ndltd.ncl.edu.tw/handle/96235733339930486968 |