The Fabrication and Characterization of Metal(Al)-Oxide-Si Capacitors and Field-effect Transistors Using Dy2O3 and Sm2O3 Gate Oxide

碩士 === 國立清華大學 === 電子工程研究所 === 94 === Abstract Metal-insulator-semiconductor (MIS) capacitors and n-channel Metal-oxide-semiconductor-field-effective-transistors (MOSFETs) with Sm2O3 and Dy2O3 gate dielectrics were fabricated. The electrical conduction mechanism in Sm2O3 thin films was investi...

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Bibliographic Details
Main Authors: Yu-Ren Hwang, 黃郁仁
Other Authors: Joseph Ya-Min Lee
Format: Others
Language:zh-TW
Published: 2006
Online Access:http://ndltd.ncl.edu.tw/handle/17705595910958225192