A Wireless Digital IC Test System
碩士 === 國立清華大學 === 電機工程學系 === 94 === Abstract Test cost and test accuracy are very important issues in novel circuit designs. According to the ITRS’03 report, test cost will never decrease with the advancement of integrate circuit fabrication technology. Focused on the test challenges, wireless...
| Main Authors: | , |
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| Other Authors: | |
| Format: | Others |
| Language: | en_US |
| Published: |
2006
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| Online Access: | http://ndltd.ncl.edu.tw/handle/37336746355630918452 |