Analysis and measurement of an intra-chip or inter-chip global interconnect by using LTCC manufacturing process

碩士 === 國立臺灣大學 === 電子工程學研究所 === 94 === This thesis is based on the concept of the System in Package to solve the problem of transmission of intra-chip or inter-chip global interconnect by using the LTCC (low temperature co-fired ceramic) process. By using the multilayer structure of LTCC, the chip de...

Full description

Bibliographic Details
Main Authors: Kun-Chih Lin, 林坤志
Other Authors: 盧信嘉
Format: Others
Language:en_US
Published: 2006
Online Access:http://ndltd.ncl.edu.tw/handle/79239311393002542374