Investigation of Reliability on AC bias Stress and Performance Improvement of Thin Film Transistors
碩士 === 國立臺灣科技大學 === 電子工程系 === 94 === In this dissertation, the instability of a-Si:H TFTs with different AC bias stressing frequency conditions stressed at DC and AC bias was discussed. It was found that the mechanism of threshold voltage shift is composed of charge trapping and state creation....
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| Format: | Others |
| Language: | zh-TW |
| Published: |
2006
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| Online Access: | http://ndltd.ncl.edu.tw/handle/xbhbm4 |