Evaluation of Ternary Alloy TaCoN Thin Films Deposited by Reactive Sputtering for Copper Metallization

碩士 === 國立虎尾科技大學 === 光電與材料科技研究所 === 94 === Thin-film properties and diffusion barrier characteristics of TaCoN films on silicon substrate prepared by a dc reactive magnetron sputtering at different nitrogen partial pressures are investigated. This work examines the sputtering nitrogen partial pressur...

Full description

Bibliographic Details
Main Authors: Ming-Li Ker, 柯銘禮
Format: Others
Language:zh-TW
Published: 2006
Online Access:http://ndltd.ncl.edu.tw/handle/af545b