Applying Rough Set Theory in EWMA Controller to Improve the Process of CMP

碩士 === 東海大學 === 工業工程與經營資訊學系 === 94 === Chemical mechanical polishing(CMP) is the only technique to achieve global flat. Its unique polishing nature widely uses in the wafer surface outline smoothly, is a quite important part in the semiconductor manufacturing process. Because statistical process c...

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Bibliographic Details
Main Authors: Ming-Shiung Chang, 張銘雄
Other Authors: Chin-Yin Huang
Format: Others
Language:zh-TW
Published: 2006
Online Access:http://ndltd.ncl.edu.tw/handle/50222662812611183225