Defect Search and Classification in TFT-LCD Inspection

碩士 === 國立臺北科技大學 === 工業工程與管理系所 === 94 === As the demands of higher resolution and larger size of TFT-LCD, it becomes more critical for the TFT-LCD industry to find an efficient and effective way of defect inspection. Although the TFT-LCD industry has put lots of automatic techniques into practice, th...

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Bibliographic Details
Main Authors: Yu-Te Lu, 呂俞德
Other Authors: 梁曉帆
Format: Others
Language:zh-TW
Published: 2006
Online Access:http://ndltd.ncl.edu.tw/handle/pg4zap