Development of Automatic TFT-LCD Mura Defect Detection
碩士 === 國立臺北科技大學 === 自動化科技研究所 === 94 === An innovative TFT-LCD defect detection algorithm is developed for automatic detection of Mura defects based on Discrete Cosine Transform (DCT) principle for background image reconstruction. Efficient and accurate surface defect detection on FPD panels has neve...
| Main Authors: | , |
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| Other Authors: | |
| Format: | Others |
| Language: | zh-TW |
| Published: |
2006
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| Online Access: | http://ndltd.ncl.edu.tw/handle/7ru4eh |