A Novel Hardware Architecture for Low Power and Rapid Testing of VLSI Circuits
碩士 === 淡江大學 === 電機工程學系碩士班 === 94 === Modern design and package technologies make external testing increasingly difficult and the built-in self-test (BIST) has emerged as a promising solution to the VLSI testing problem. BIST is a design for testability methodology aimed at detecting faulty component...
| Main Authors: | , |
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| Format: | Others |
| Language: | en_US |
| Published: |
2004
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| Online Access: | http://ndltd.ncl.edu.tw/handle/59903918325175860174 |