Applying Signal Detection Theory to investigate the quality and performance of visual inspection tasks on dynamic patterns
碩士 === 中原大學 === 工業工程研究所 === 95 === ABSTRACT The main purpose of the research is discussing about the back-end process of semiconductor that after testing process, in order to ensure products appearance quality, and avoid the defects flow to the customers, building up a dynamic visual inspection proc...
| Main Authors: | , |
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| Format: | Others |
| Language: | zh-TW |
| Online Access: | http://ndltd.ncl.edu.tw/handle/85863532691704317905 |