Defect Detect System of the C-type Mask Based on Machine Vision
碩士 === 大葉大學 === 機電自動化研究所碩士班 === 95 === The research develops a machine vision to inspect the C-type mask. The image process technique is divided into two parts. The first part is an image preprocess, including color space transformation, image filtering and morphology. The second part is defect insp...
| Main Authors: | , |
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| Other Authors: | |
| Format: | Others |
| Language: | zh-TW |
| Published: |
2007
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| Online Access: | http://ndltd.ncl.edu.tw/handle/51767269826571907083 |