A Comparison of Methods for Measuring Process Capability Index Cpk in the Presence of Measurement Errors

碩士 === 逢甲大學 === 工業工程與系統管理學研究所 === 95 === Process capability indices have been widely used to provide numerical measures on process performance in the manufacturing industry. Most of research works on process capability analysis have assumed no gauge measurement errors. Such assumption does not refle...

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Bibliographic Details
Main Authors: Wei-chen Chien, 簡偉宸
Other Authors: Chien-Wei Wu
Format: Others
Language:zh-TW
Published: 2007
Online Access:http://ndltd.ncl.edu.tw/handle/16200936465235489345