Source Rapid Thermal Process to Enhance Power MOSFET Avalanche Breakdown
碩士 === 逢甲大學 === 電子工程所 === 95 === In this thesis describes the analysis way for the simulation models and improving avalanche breakdown by Power MOSFET process. Failure of a power MOSFET in the avalanche mode results from forward biasing the base emitter junction of the parasitic NPN transistor, turn...
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| Format: | Others |
| Language: | zh-TW |
| Online Access: | http://ndltd.ncl.edu.tw/handle/63045502696885908895 |