Crosstalk Estimation for Coupled RLC Interconnects by Sensitivity Computation Based on Pole-zero Analysis

碩士 === 逢甲大學 === 電子工程所 === 95 === Coupled noise between signal lines is a potential cause of failure in high-speed electronic systems. It is well accepted that on-chip interconnect plays an important role in the performance and signal integrity of deep submicrometer VLSI circuits. Being increasing of...

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Bibliographic Details
Main Authors: Hou-Yi Hung, 洪厚益
Other Authors: Tsung-Chih Lin
Format: Others
Language:zh-TW
Published: 2007
Online Access:http://ndltd.ncl.edu.tw/handle/70676955396015001480