Efficient BISR Techniques for Embedded Memories Considering Cluster Faults
碩士 === 輔仁大學 === 電子工程學系 === 95 === In today’s deep sub-micron technology era, the density and capacity of the system-on-a-chip (SOC) is increasing significantly. Moreover, embedded memories usually occupy the greatest part of the SOC. The yield of the embedded memories will dominate the SOC yield. Ba...
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| Format: | Others |
| Language: | en_US |
| Published: |
2007
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| Online Access: | http://ndltd.ncl.edu.tw/handle/74332779595349629517 |