Resource of functionality test erroneous judgment on DIMM Module

碩士 === 義守大學 === 電子工程學系半導體暨封裝測試產業研發碩士 === 95 === Based on the example of testing “SO-DIMM 512MB 667Mhz memory module in the notebook,” this thesis is to discuss the erroneous situations happened in the memory module during the testing process in the production line. However, the erroneous situations...

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Bibliographic Details
Main Authors: Chen-En Wang, 王晟恩
Other Authors: Chii-Maw Uang
Format: Others
Language:zh-TW
Online Access:http://ndltd.ncl.edu.tw/handle/50139706553667313921