Analysis of atomic force microscopy scanning an inclined topography and electrostatic force
碩士 === 崑山科技大學 === 機械工程研究所 === 95 === The study is to establish the dynamic measuring modes of inclined microprobes probe of an atomic force microscopy. The forced vibration of a inclined angle non-uniform beam with the time-dependent elastic boundary conditions, damping and concentrated tip mass is...
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| Format: | Others |
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2007
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| Online Access: | http://ndltd.ncl.edu.tw/handle/92273765923764585088 |