Study on the Reliability of P Channel Poly-Silicon Thin Film Transistors

碩士 === 中興大學 === 電機工程學系所 === 95 === Poly-Si TFTs has been widely used recently, and nowadays, the reliability of TFTs plays an important role. When poly-Si TFTs are applied to the flat panel displays, the TFTs is driven by AC signal. Therefore, the reliability test is not only focus on DC bias stress...

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Bibliographic Details
Main Authors: Wei-Chun Chang, 張為鈞
Other Authors: Han-Wen Liu
Format: Others
Language:en_US
Online Access:http://ndltd.ncl.edu.tw/handle/32549097390574587157