Study on the Reliability of P Channel Poly-Silicon Thin Film Transistors
碩士 === 中興大學 === 電機工程學系所 === 95 === Poly-Si TFTs has been widely used recently, and nowadays, the reliability of TFTs plays an important role. When poly-Si TFTs are applied to the flat panel displays, the TFTs is driven by AC signal. Therefore, the reliability test is not only focus on DC bias stress...
| Main Authors: | , |
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| Format: | Others |
| Language: | en_US |
| Online Access: | http://ndltd.ncl.edu.tw/handle/32549097390574587157 |