The Study of lower confidence limit for non-normally process capability indices
碩士 === 國立勤益科技大學 === 工業工程與管理系 === 95 === Process capability indices (PCIs) have been introduced to provide numerical measures on whether a manufacturing process is capable of reproducing items meeting the specifications predetermined by the consumers. Process yield is the most common criteria used fo...
| Main Authors: | , |
|---|---|
| Other Authors: | |
| Format: | Others |
| Language: | zh-TW |
| Published: |
2007
|
| Online Access: | http://ndltd.ncl.edu.tw/handle/97367482762878554546 |