Application of Machine Vision for Packaged IC Surface defect detection

碩士 === 國立成功大學 === 工程科學系專班 === 95 === Machine Vision system has been widely used in manufacturing industry for production manufactures, production monitoring and quality control. Usually, a computer vision system includes camera, lighting, image capture card, required image processing software, and c...

Full description

Bibliographic Details
Main Authors: Heng OuYang, 歐陽衡
Other Authors: Ming-Shi Wang
Format: Others
Language:zh-TW
Published: 2007
Online Access:http://ndltd.ncl.edu.tw/handle/93247929437383333559