Construction of Blind-Build W/S Production Flow and Cost Analysis– A Case Study of “A” Company
碩士 === 國立成功大學 === 工學院工程管理專班 === 95 === Generally Speaking, from the beginning of IC design to first silicon debugging and till to mass-production, wafer sort yield is always the important key performance index between IC design house and the factory, so they will keep monitoring the daily wafer sort...
| Main Authors: | , |
|---|---|
| Other Authors: | |
| Format: | Others |
| Language: | zh-TW |
| Published: |
2007
|
| Online Access: | http://ndltd.ncl.edu.tw/handle/09098981523717494851 |