Development and Hot-Carrier Reliability Study of Integrated High-Voltage MOSFET Transistors
博士 === 國立成功大學 === 電機工程學系碩博士班 === 95 === In this dissertation, the integrated high-voltage MOSFET with three different kinds of application, structure and operation voltage are studied and analyzed on hot-carrier reliability and process conditions correlations. Comparing the hot-carrier reliability o...
| Main Authors: | , |
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| Other Authors: | |
| Format: | Others |
| Language: | en_US |
| Published: |
2007
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| Online Access: | http://ndltd.ncl.edu.tw/handle/16242266300247122086 |