TFT-LCD Mura Defect Detection using Wavelet Transforms
碩士 === 國立成功大學 === 製造工程研究所碩博士班 === 95 === Mura defects in LCM panel of TFT-LCD have the properties of local low contrast and luminance variation without a clear contour on a uniformly produced surface. This thesis proposes two methods which are discrete cosine transform (DCT) and discrete wavelet tra...
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| Format: | Others |
| Language: | zh-TW |
| Published: |
2007
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| Online Access: | http://ndltd.ncl.edu.tw/handle/56918240460013736764 |