TFT-LCD Defects Inspection using Independent Component Analysis
碩士 === 國立成功大學 === 製造工程研究所碩博士班 === 95 === Thresholding technique which has been widely used in the detection of defects is to automatically select an optimal threshold for separating objects from the background based on their gray-level distribution. However, this method is not suitable for TFT-LCD d...
| Main Authors: | , |
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| Other Authors: | |
| Format: | Others |
| Language: | zh-TW |
| Published: |
2007
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| Online Access: | http://ndltd.ncl.edu.tw/handle/67517894761486437787 |