Effect of Electrostatic Forces on the Topographic Height Measurement in Frequency Modulated Atomic Force Microscopy
博士 === 國立交通大學 === 物理研究所 === 95 === The objective of this thesis mainly focuses on the discussion of deviation in topographic height measurement measured by the frequency-modulated atomic force microscopy as the electrostatic force is applied or not applied. The effect of electrostatic force between...
| Main Authors: | , |
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| Other Authors: | |
| Format: | Others |
| Language: | en_US |
| Published: |
2006
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| Online Access: | http://ndltd.ncl.edu.tw/handle/61442006516830532242 |