THE CROSS-INTERACTION OF TWO INTERFACIAL REACTIONS IN SOLDER JOINTS

博士 === 國立中央大學 === 化學工程與材料工程研究所 === 95 === The Au, Cu, Ni and Sn are the most common materials in the solder joints of electronic packages. In this thesis, the Au/Sn/Ni, Au/SnPb/Ni, Ni/Sn/Cu and Au/Sn/Cu ternary diffusion couples were used to investigate the solder volume effect on the cross-interact...

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Bibliographic Details
Main Authors: Chien-wei Chang, 張建偉
Other Authors: 高振宏, 鄭紹良
Format: Others
Language:en_US
Published: 2007
Online Access:http://ndltd.ncl.edu.tw/handle/61686353964640824775