Defect reduction and environment stress quality test (ESQT) on GaN p-i-n UV sensor n
博士 === 國立中央大學 === 電機工程研究所 === 95 === This dissertation presents systematically fabricated GaN p-i-n ultraviolet (UV) photo detectors that have demonstrated improved device structure and superior sensor performance. Studies of the material growth, device fabrication and sensor characterization are de...
| Main Authors: | , |
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| Format: | Others |
| Language: | en_US |
| Published: |
2007
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| Online Access: | http://ndltd.ncl.edu.tw/handle/41831825063700318678 |