The Relation Between Tin Whisker Growth and Stresses,Temperatures

碩士 === 國立中央大學 === 機械工程研究所碩士在職專班 === 95 === The purpose of this study is to investigate the tin whisker growth behavior on bright tin-plated copper under different applied stresses at room temperature (RT) and 50 ℃. Scanning electron microscopy (SEM) was employed to observe the tin whisker growth beh...

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Bibliographic Details
Main Authors: Tung-Hsien Lin, 林東賢
Other Authors: Chih-Kuang Jack Lin
Format: Others
Language:zh-TW
Online Access:http://ndltd.ncl.edu.tw/handle/43045037290305807530