Built-In Self-Test Design and Diagnosis Design for SRAM-Based FPGA
碩士 === 國立東華大學 === 電機工程學系 === 95 === As the great increasing in VLSI process technology, Field Programmable Gate Arrays (FPGAs) have reached unprecedented levels of complexity, containing embedded high speed I/O processors, random access memory (RAM) block, so that it has properties of low designing...
Main Authors: | , |
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Other Authors: | |
Format: | Others |
Language: | en_US |
Published: |
2007
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Online Access: | http://ndltd.ncl.edu.tw/handle/pkf6mh |