Built-In Self-Test Design and Diagnosis Design for SRAM-Based FPGA
碩士 === 國立東華大學 === 電機工程學系 === 95 === As the great increasing in VLSI process technology, Field Programmable Gate Arrays (FPGAs) have reached unprecedented levels of complexity, containing embedded high speed I/O processors, random access memory (RAM) block, so that it has properties of low designing...
| Main Authors: | , |
|---|---|
| Other Authors: | |
| Format: | Others |
| Language: | en_US |
| Published: |
2007
|
| Online Access: | http://ndltd.ncl.edu.tw/handle/pkf6mh |