AFM-Based Nanolithography and Detection of DNA Hybridization Reactions at the Nanoscale
碩士 === 國立中山大學 === 化學系研究所 === 95 === High-resolution lattice periodicity images of a variety of well-defined surfaces, including graphite, mica, and Au(111), validated the good stability of our atomic force microscope (AFM) system. Combining self-assembled monolayer (SAM) and AFM technology, we demon...
| Main Authors: | , |
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| Format: | Others |
| Language: | zh-TW |
| Published: |
2007
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| Online Access: | http://ndltd.ncl.edu.tw/handle/gtyknx |