Study of Near-field Patterns on Metal Slits, Nanowires, and Nanodots by Near-field Scanning Optical Microscopy

碩士 === 國立清華大學 === 材料科學工程學系 === 95 === By using transmission near-field scanning optical microscopy (NSOM), near-field optical distributions are studied when green laser source (532 nm) is illuminated on the substrate side of the sample. Three types of structures: macroslits, nanowire array and nanod...

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Bibliographic Details
Main Authors: Chan-Lu Su, 蘇展祿
Other Authors: Heh-Nan Lin
Format: Others
Language:en_US
Published: 2007
Online Access:http://ndltd.ncl.edu.tw/handle/17525871855894173861