STI Effect on Flicker Noise in 0.13-um RF CMOSFET

碩士 === 國立清華大學 === 電子工程研究所 === 95 === To improve the performance of high frequency CMOS integrated circuits for achieving high-speed communication systems, the channel length and gate insulator thickness in MOSFET transistors are continuously scaled down. However, as the dimension keeps reducing, man...

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Bibliographic Details
Main Authors: Yen-Chun Huang, 黃彥鈞
Other Authors: Shuo-Hung Hsu
Format: Others
Language:en_US
Published: 2007
Online Access:http://ndltd.ncl.edu.tw/handle/73503976941557594144