Built-In Speed Grading with a Process-Tolerant All-Digital Phase-Locked Loop
碩士 === 國立清華大學 === 電機工程學系 === 95 === Speed grading has becoming more and more important for nanometer technologies to support activities like process monitoring or performance diagnosis. In this work, we analyze the feasibility of providing such a capability through on-chip circuitry. This Built-In S...
| Main Authors: | , |
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| Other Authors: | |
| Format: | Others |
| Language: | zh-TW |
| Published: |
2007
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| Online Access: | http://ndltd.ncl.edu.tw/handle/08780456070459777084 |