Test Cost Estimation for Wireless Wafer Test
碩士 === 國立清華大學 === 電機工程學系 === 95 === Test cost and test accuracy are the issues that must be considered in the stage of testing. Many dies can be integrated into single chip with the advancement of integrated circuit fabrication technology, but it makes the testing face stern challenges. Because the...
| Main Authors: | , |
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| Format: | Others |
| Language: | en_US |
| Published: |
2007
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| Online Access: | http://ndltd.ncl.edu.tw/handle/55250650699963330631 |