In-situ Monitoring the Etching Process of High-K Material by Modulation Ellipsometer

碩士 === 國立清華大學 === 工程與系統科學系 === 95 ===

Bibliographic Details
Main Authors: CHI-WEN HSIEH, 謝啟文
Other Authors: 林滄浪
Format: Others
Language:zh-TW
Published: 2007
Online Access:http://ndltd.ncl.edu.tw/handle/49215270794215308198